Summary:

Localization microscopy is often precise but inaccurate. This fundamental problem is becoming more important as localization methods mature and critical technologies become more demanding. We lead the development of innovative standards and calibrations to achieve accuracy in localization microscopy [1, 2, 3], with applications ranging from fabricating quantum devices to characterizing nanoplastic standards. Our project is interdisciplinary, and we seek outstanding applicants with high motivation and strong backgrounds in the physical sciences.

Contact:

Thank you for your interest in this research opportunity. For more information, please email samuel.stavis@nist.gov.

References:

[1] Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield, C. R. Copeland, A. L. Pintar, R. G. Dixson, A. Chanana, K Srinivasan, D. A. Westly, B. Robert Ilic, M. I. Davanco, S. M. Stavis, Optica Quantum 2, (2), 72-84 (2024).

[2] Accurate localization microscopy by intrinsic aberration calibration, C. R. Copeland, C. D. McGray, B. Robert Ilic, J. Geist, and S. M. Stavis, Nature Communications 12, 3925 (2021).

[3] Subnanometer localization accuracy in widefield optical microscopy, C. R. Copeland, J. Geist, C. D. McGray, V. A. Aksyuk, J. A. Liddle, B. R. Ilic, and S. M. Stavis, Light: Science & Applications 7, 31 (2018).

Accuracy; Calibration; Correlative; Localization; Lithography; Metrology; Microscopy; Optical; Precision; Standard; Tracking

citizenship

Open to U.S. citizens

level

Open to Postdoctoral applicants